กล้องจุลทรรศน์อิเล็กตรอนแบบสแกน (REM)

Zeiss XB 350

Scanning Electron Microscope (SEM) Zeiss XB 350

Configuration and Accessories
• Without FIB Column
• SmartSEM- and SmartFIB-Software
• GIS with Pt Precursor
• Integrated Plasma Cleaner
• EDS Oxford Xplore 30 (incl. Interface & Software)
• Automatically 200 mm Air Lock
• Electrical Feed-Through (2 x 15 Channels)
• Circulation Cooling
• Vacuum Buffer Tank (Quiet Mode)
• ... and Table, Screen, Control Panel (i.e. Unique Zeiss Keyboard + Joystick) and Misc. Probe Holders

Launch: August 2024
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Site: Germany, Mainz
Available at short notice by arrangement. The SEM is still in operation and can be viewed and demonstrated.

The device has no defects or quirks and is fully functional.

Further information available on request!