เครื่องวัดความหนาชั้นเคลือบด้วยรังสีเอกซ์Helmut Fischer
FISCHERSCOPE XDL-XYZpT8
เครื่องวัดความหนาชั้นเคลือบด้วยรังสีเอกซ์
Helmut Fischer
FISCHERSCOPE XDL-XYZpT8
ราคาคงที่ ยังไม่รวมภาษีมูลค่าเพิ่ม
€3,500
สภาพ
ใช้แล้ว
ที่ตั้ง
Borken 

ข้อมูลเกี่ยวกับเครื่องจักร
- ชื่อเครื่องจักร:
- เครื่องวัดความหนาชั้นเคลือบด้วยรังสีเอกซ์
- ผู้ผลิต:
- Helmut Fischer
- สภาพ:
- สภาพดีมาก (มือสอง)
ราคาและสถานที่
ราคาคงที่ ยังไม่รวมภาษีมูลค่าเพิ่ม
€3,500
- ที่ตั้ง:
- Einsteinstraße 8a, 46325 Borken, Deutschland

โทร
รายละเอียดข้อเสนอ
- รหัสประกาศ:
- A22811900
- หมายเลขอ้างอิง:
- 25371
- อัปเดต:
- อัปเดตล่าสุดเมื่อ 24.09.2569
คำอธิบาย
HELMUT FISCHER
X-ray fluorescence measuring device / film thickness measuring device
FISCHERSCOPE X-RAY XDL-XYZpT8
Professional X-ray fluorescence measuring system
for film thickness and material analysis
For sale is a used X-ray fluorescence measuring device
from the manufacturer Helmut Fischer GmbH + Co. KG, Germany.
The FISCHERSCOPE X-RAY is suitable for non-destructive film thickness measurement
and material analysis using X-ray fluorescence (XRF).
The system is designed for measurements of functional layers, anti-corrosion layers,
and various metallic coatings, and is used in quality assurance, laboratories,
research, and manufacturing.
Technical data:
Manufacturer: Helmut Fischer GmbH + Co. KG
Model: FISCHERSCOPE X-RAY
Type: XDL-XYZpT8
Serial number: SN010002436
Made in Germany
CE marking present
Measuring system:
X-ray fluorescence measuring device (XRF)
For non-destructive film thickness measurement
Suitable for functional layers and anti-corrosion layers
Large measuring chamber with C-shaped slit
Standard X-ray tube
Proportional counter
Fixed aperture and fixed filter
DCM travel 0–80 mm
Electrical data:
Supply voltage: 230 V AC
Frequency: 50–60 Hz
Power consumption: 120 W
Connections:
Power connection
Serial interface (Sub-D)
Other connections as shown in the pictures
Equipment:
Helmut Fischer FISCHERSCOPE X-RAY measuring device
Measuring chamber with protective cover
Software
Operating manual
Additional accessories as shown in the pictures
Lsdjz Egi Ropfx Aitort
Areas of application:
Film thickness measurement
Material analysis
X-ray fluorescence analysis (XRF)
Quality assurance
Electroplating
Surface technology
Material testing
Laboratory
Research and development
Scope of supply:
Helmut Fischer FISCHERSCOPE X-RAY XDL-XYZpT8
Software
Operating manual
Scope of supply as shown in the pictures
Condition:
Used
The device comes from a warehouse clearance.
Optical condition as shown in the pictures.
Important note:
The device has not been tested by us and is sold explicitly
as is and without warranty.
The table shown in the photos, as well as other items not explicitly
mentioned, are not part of the sale.
Due to its size and weight, shipping can be arranged via a freight forwarder.
Subject to changes, errors and prior sale.
We will be happy to answer any further questions by telephone.
โฆษณานี้ได้รับการแปลโดยอัตโนมัติ อาจมีข้อผิดพลาดในการแปลได้
X-ray fluorescence measuring device / film thickness measuring device
FISCHERSCOPE X-RAY XDL-XYZpT8
Professional X-ray fluorescence measuring system
for film thickness and material analysis
For sale is a used X-ray fluorescence measuring device
from the manufacturer Helmut Fischer GmbH + Co. KG, Germany.
The FISCHERSCOPE X-RAY is suitable for non-destructive film thickness measurement
and material analysis using X-ray fluorescence (XRF).
The system is designed for measurements of functional layers, anti-corrosion layers,
and various metallic coatings, and is used in quality assurance, laboratories,
research, and manufacturing.
Technical data:
Manufacturer: Helmut Fischer GmbH + Co. KG
Model: FISCHERSCOPE X-RAY
Type: XDL-XYZpT8
Serial number: SN010002436
Made in Germany
CE marking present
Measuring system:
X-ray fluorescence measuring device (XRF)
For non-destructive film thickness measurement
Suitable for functional layers and anti-corrosion layers
Large measuring chamber with C-shaped slit
Standard X-ray tube
Proportional counter
Fixed aperture and fixed filter
DCM travel 0–80 mm
Electrical data:
Supply voltage: 230 V AC
Frequency: 50–60 Hz
Power consumption: 120 W
Connections:
Power connection
Serial interface (Sub-D)
Other connections as shown in the pictures
Equipment:
Helmut Fischer FISCHERSCOPE X-RAY measuring device
Measuring chamber with protective cover
Software
Operating manual
Additional accessories as shown in the pictures
Lsdjz Egi Ropfx Aitort
Areas of application:
Film thickness measurement
Material analysis
X-ray fluorescence analysis (XRF)
Quality assurance
Electroplating
Surface technology
Material testing
Laboratory
Research and development
Scope of supply:
Helmut Fischer FISCHERSCOPE X-RAY XDL-XYZpT8
Software
Operating manual
Scope of supply as shown in the pictures
Condition:
Used
The device comes from a warehouse clearance.
Optical condition as shown in the pictures.
Important note:
The device has not been tested by us and is sold explicitly
as is and without warranty.
The table shown in the photos, as well as other items not explicitly
mentioned, are not part of the sale.
Due to its size and weight, shipping can be arranged via a freight forwarder.
Subject to changes, errors and prior sale.
We will be happy to answer any further questions by telephone.
โฆษณานี้ได้รับการแปลโดยอัตโนมัติ อาจมีข้อผิดพลาดในการแปลได้
ส่งคำขอ
โทรศัพท์ & แฟกซ์
+49 2861 ... โฆษณา
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